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Equipment:

 

Scanning Probe Microscope NT-MDT NTegra Aura

 

Scanning Probe Microscope NT-MDT Solver P47 Pro

 

 Cryogenic Scanning Tunneling Microscope NT-MDT

 

Oxford Instruments Optibath SXM Cryostat

    operating temperature range 1,5 - 300 K

 

Transport Measurements Setup

 

Low Current / High Resistance Measurements Setup

 

Typical results:

    

AFM topography of poly-crystalline TiO2 thin film (left) and nano-crystalline TiB2 thin film (right) deposited by magnetron sputtering.

 

Scanning Spreading Resistance Microscopy image of YBCO surface (left) and Kelvin Probe Force Microscopy image of surface potential patterns created on hydroxyapatite films by focused electron beam.

 

Typical current-voltage characteristics of YBa2Cu3O7-x/Ag planar junctions exhibiting resistance switching behavior (left) and differential (dI/dV-V) characteristics of point-contact junction on MgB2.

 

Staff:

RNDr. Tomáš Plecenik, PhD.

e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. , Phone: +421-2-60295-274, 243, 190

Ing. Maroš Gregor, PhD., Prof. RNDr. Andrej Plecenik, DrSc., Prof. RNDr. Peter Kúš, DrSc.

 

PhD. Students: 

RNDr. Martin Truchlý

e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. , Mobile phone:

Mgr. Robert Sobota:

e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. , Mobile phone:+421 915 474 352